论文标题
测量Gregor Fabry-Pérot干涉仪的Etalon质量
Measuring the Etalon Quality of the GREGOR Fabry-Pérot Interferometer
论文作者
论文摘要
成像光谱极化是太阳能物理学中的重要观察工具，因为具有高光谱分辨率，较大的视野及其固有的对事后图像恢复的适合性，因此具有快速的光谱扫描。 Fabry-Pérot等人是这些仪器的关键光学元素。他们的光学质量批判性地定义了乐器的性能。 Gregor Fabry-Pérot干涉仪（GFPI）的两个Etalon使用了10多年，这引发了有关Etalons涂层潜在恶化的问题。我们介绍了Etalons光学质量的评估，描述了基于Zernike多项式的检查方法，讨论Finesse的现场依赖性及其对仪器设计的后果，并研究测量技术对实现平行板并行性的影响。我们发现，延长暴露于阳光会影响etalon涂层，即降低峰值的传播并留下直接暴露于阳光的eTalon上Gregor太阳能望远镜的瞳孔的烙印。然而，这两个eTalon的技巧仍然很高，因此对成像光谱法的影响可以忽略不计。
Imaging spectropolarimetry is an important observational tool in solar physics because of fast-cadence spectral scans with high-spectral resolution, large field-of-view, and its inherent suitability for post-facto image restoration. Fabry-Pérot etalons are the key optical elements of these instruments. Their optical quality critically defines the instrument's performance. The two etalons of the GREGOR Fabry-Pérot Interferometer (GFPI) were used for more than 10~years, raising questions about the potential deterioration of etalons coatings. We present an assessment of the etalons optical quality, describe the inspection method based on Zernike polynomials, discuss the field dependence of the finesse and its consequences for instrument design, and investigate the impact of the measurement technique to achieve plate parallelism. We find that extended exposure to sunlight affects the etalon coatings, i.e., lowering the peak transmission and leaving an imprint of the pupil of the GREGOR solar telescope on the etalon that is directly exposed to sunlight. The finesse of both etalons, however, remains high so that the impact on imaging spectropolarimetry is negligible.
