论文标题
Ab-Initio傅立叶转换的准粒子干扰图和应用于拓扑绝缘体BI $ _2 $ te $ _3 $
Ab-initio Theory of Fourier-transformed Quasiparticle Interference Maps and Application to the Topological Insulator Bi$_2$Te$_3$
论文作者
论文摘要
准粒子干扰（QPI）技术是一种强大的工具，可以揭示材料的电子结构的结构和特性，并结合了表面上缺陷的散射特性。最近，该技术在证明拓扑绝缘子表面状态的独特特性方面至关重要，这些特性在没有反向散射的情况下表现出来。在这项工作中，我们得出了一种基于绿色函数的形式主义，用于从头开始计算傅立叶转换的QPI图像。我们在QPI的示例中显示了我们新实施的效率，该QPI围绕磁性和非磁性缺陷形成Bi $ _2 $ TE $ _3 $表面。这种方法可以加深对拓扑保护电子的散射特性的深入了解，并且将来可能是研究量子材料的有用工具。
The quasiparticle interference (QPI) technique is a powerful tool that allows to uncover the structure and properties of electronic structure of a material combined with scattering properties of defects at surfaces. Recently this technique has been pivotal in proving the unique properties of the surface state of topological insulators which manifests itself in the absence of backscattering. In this work we derive a Green function based formalism for the ab initio computation of Fourier-transformed QPI images. We show the efficiency of our new implementation at the examples of QPI that forms around magnetic and non-magnetic defects at the Bi$_2$Te$_3$ surface. This method allows a deepened understanding of the scattering properties of topologically protected electrons off defects and can be a useful tool in the study of quantum materials in the future.
