论文标题
成像Andreev在石墨烯中的反射
Imaging Andreev Reflection in Graphene
论文作者
论文摘要
可以通过Andreev反射将沿弹道路径的连贯的电荷传输引入石墨烯，为此，电子从超导接触作为一个孔中反射，而库珀对则会传播。我们使用液态冷却扫描栅极显微镜（SGM）来对磁聚焦状态中的石墨烯中的Andreev反射进行图像，在该方案中，携带者沿着触点之间的回旋轨道移动。通过偏转载波路径并显示导致电导的变化来获得流动图像。当电子进入超导体时，安德里夫（Andreev）的漏洞出发用于收集接触。为了测试结果，我们用大电流和高于临界温度的加热来破坏Andreev反射。在这两种情况下，反射的载体从孔变为电子。
Coherent charge transport along ballistic paths can be introduced into graphene by Andreev reflection, for which an electron reflects from a superconducting contact as a hole, while a Cooper pair is transmitted. We use a liquid-helium cooled scanning gate microscope (SGM) to image Andreev reflection in graphene in the magnetic focusing regime, where carriers move along cyclotron orbits between contacts. Images of flow are obtained by deflecting carrier paths and displaying the resulting change in conductance. When electrons enter the the superconductor, Andreev-reflected holes leave for the collecting contact. To test the results, we destroy Andreev reflection with a large current and by heating above the critical temperature. In both cases, the reflected carriers change from holes to electrons.
