论文标题
晶体屏蔽可缓解结构重排，并在振荡剪切系统下将记忆定位
Crystalline shielding mitigates structural rearrangement and localizes memory in jammed systems under oscillatory shear
论文作者
论文摘要
压力下的无定形材料的产量性质尚未完全阐明。特别是，了解微观重排如何产生无序系统中的宏观结构和流变学特征对于预测和表征的产量以及研究记忆如何存储在无序材料中至关重要。在这里，我们研究了在振荡性剪切下的无定形二维系统中，局部结构均匀性在单个粒子水平上的演变，并将这种演变与重排，记忆和宏观的流变学测量联系起来。我们确定了一种新的结构指标，结晶屏蔽，可预测剪切下各个颗粒的重排倾向和结构波动。我们使用此指标来确定保留材料预备的系统记忆的系统的局部区域。我们的结果有助于越来越多地了解本地结构与无序系统中动态响应和记忆的关系。
The nature of yield in amorphous materials under stress has yet to be fully elucidated. In particular, understanding how microscopic rearrangement gives rise to macroscopic structural and rheological signatures in disordered systems is vital for the prediction and characterization of yield and for the study of how memory is stored in disordered materials. Here, we investigate the evolution of local structural homogeneity on an individual particle level in amorphous jammed two-dimensional systems under oscillatory shear, and relate this evolution to rearrangement, memory, and macroscale rheological measurements. We identify a new structural metric, crystalline shielding, that is predictive of rearrangement propensity and the structural volatility of individual particles under shear. We use this metric to identify localized regions of the system in which the material's memory of its preparation is preserved. Our results contribute to a growing understanding of how local structure relates to dynamic response and memory in disordered systems.
