论文标题

通过深度神经网络利用硬件损坏的带外信息,以进行强大的无线设备分类

Leveraging Hardware-Impaired Out-of-Band Information Through Deep Neural Networks for Robust Wireless Device Classification

论文作者

Elmaghbub, Abdurrahman, Hamdaoui, Bechir

论文摘要

无线设备分类技术在促进新兴的无线应用程序中起着关键作用,例如允许频谱监管机构执行其访问策略,并使网络管理员能够控制访问并防止对其无线网络进行模拟攻击。通过在制造和组装阶段造成的收发器硬件障碍引起的传输RF信号的频谱扭曲,以提供设备分类,这是许多近期工作的重点。这些先前的作品实质上应用了深度学习来从其硬件受损的信号中提取设备的功能,并依靠设备上的功能变化来区分彼此的设备。随着技术的发展,设备之间的制造障碍变化变得极为微不足道,使这些先前的分类方法不准确。本文提出了一种新颖的,深度学习的技术,即使设备在其硬件障碍中表现出微不足道的变化,并且具有相同的硬件,协议和软件配置。提出的技术的新颖性在于利用{\ em in-band}和{\ em频段外}信号失真信息,通过对接收器的捕获信号和从RF信号收集到的iQ样品进行分类来进行分类。使用卷积神经网络(CNN)模型,我们表明,当应用于具有最小扭曲硬件的高端高性能设备时,与现有方法相比,设备分类的精度会增加一倍。

Wireless device classification techniques play a key role in promoting emerging wireless applications such as allowing spectrum regulatory agencies to enforce their access policies and enabling network administrators to control access and prevent impersonation attacks to their wireless networks. Leveraging spectrum distortions of transmitted RF signals, caused by transceiver hardware impairments created during manufacture and assembly stages, to provide device classification has been the focus of many recent works. These prior works essentially apply deep learning to extract features of the devices from their hardware-impaired signals and rely on feature variations across the devices to distinguish devices from one another. As technology advances, the manufacturing impairment variations across devices are becoming extremely insignificant, making these prior classification approaches inaccurate. This paper proposes a novel, deep learning-based technique that provides scalable and highly accurate classification of wireless devices, even when the devices exhibit insignificant variation across their hardware impairments and have the same hardware, protocol, and software configurations. The novelty of the proposed technique lies in leveraging both the {\em in-band} and {\em out-of-band} signal distortion information by oversampling the captured signals at the receiver and feeding IQ samples collected from the RF signals to a deep neural network for classification. Using a convolutional neural network (CNN) model, we show that our proposed technique, when applied to high-end, high-performance devices with minimally distorted hardware, doubles the device classification accuracy when compared to existing approaches.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源