论文标题

快速模拟硅垫检测器

Fast Simulation of a Silicon-Pad Detector

论文作者

Kim, Beomkyu, Bok, Jeongsu, Cho, Jaeyoon, Cho, Jiyeon, Kwon, Jiyeon, Lee, Hyungjun, Kweon, Minjung

论文摘要

几种类型的探测器用于检测粒子和核物理实验中的带电颗粒。由于半导体检测器具有优越的空间和运动学分辨率以及良好的响应时间,因此它已成为最近最重要的检测器之一。当带电的颗粒穿过半导体检测器时,将在检测器内形成电子孔对,并通过检测器内部的电场向电极移动。目前,可以通过生成的电流信号确定轨迹和动量。 在这项研究中,我们介绍了一个名为“快速硅设备”模拟的开源应用程序,该应用程序是用于快速模拟典型的硅半导体检测器的快速模拟,例如带有反向偏置电压的N型晶圆上的P型垫。迭代和多网格方法用于快速计算模拟中的电势和电场。将模拟产生的当前信号与Silvaco TCAD和Garfield ++模拟的结果进行了比较。仿真程序基于CERN开发的根。

Several types of detectors are used to detect charged particles in particle and nuclear physics experiments. Since the semiconductor detector has superior spatial and kinematic resolutions as well as good response time than other types of detectors, it has become one of the most important detectors recently. When charged particles pass through the semiconductor detector, electron-hole pairs are formed inside the detector and move toward the electrode by the electric field inside the detector. At this time, the trajectory and momentum can be determined through the generated current signal. In this study, we introduce an open-source application named Fast Silicon Device Simulation that is developed for fast simulation of a typical silicon semiconductor detector, such as a p-type pad on an n-type wafer with a reverse-bias voltage. Iterative and multi-grid methods are used to calculate the potential and electric field in the simulation fast. Current signals produced by the simulation are compared with results by Silvaco TCAD and Garfield++ simulations. The simulation program is based on the ROOT that has been developed by CERN.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源