论文标题

安全植入设备的低功率双因子身份验证单元

A Low-Power Dual-Factor Authentication Unit for Secure Implantable Devices

论文作者

Maji, Saurav, Banerjee, Utsav, Fuller, Samuel H, Abdelhamid, Mohamed R, Nadeau, Phillip M, Yazicigil, Rabia Tugce, Chandrakasan, Anantha P

论文摘要

本文介绍了双因素身份验证协议及其针对可植入医疗设备(IMD)安全性的低功率实施。该协议使用Datagram Tlose Layer Security-预共享密钥(DTLS-PSK)结合了传统的加密第一因素身份验证,然后是用户基于触摸的自愿第二因素身份验证,以增强安全性。凭借低功率紧凑的始终唤醒计时器和基于触摸的唤醒电路,我们的测试芯片仅消耗735 pw闲置的状态功率,当时为20.15 Hz和2.5 V.硬件加速双因子身份验证单元消耗8 $μ$ W,在660 kHz和0.87 V上使用了cout chip dotter ble be。转换器,触摸传感器和硬币电池电池可展示独立的植入式操作,并使用视频测量设置进行了测试。

This paper presents a dual-factor authentication protocol and its low-power implementation for security of implantable medical devices (IMDs). The protocol incorporates traditional cryptographic first-factor authentication using Datagram Transport Layer Security - Pre-Shared Key (DTLS-PSK) followed by the user's touch-based voluntary second-factor authentication for enhanced security. With a low-power compact always-on wake-up timer and touch-based wake-up circuitry, our test chip consumes only 735 pW idle state power at 20.15 Hz and 2.5 V. The hardware accelerated dual-factor authentication unit consumes 8 $μ$W at 660 kHz and 0.87 V. Our test chip was coupled with commercial Bluetooth Low Energy (BLE) transceiver, DC-DC converter, touch sensor and coin cell battery to demonstrate standalone implantable operation and also tested using in-vitro measurement setup.

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