论文标题
基于内部反射的总超分辨率成像的总频率
Total internal reflection based super-resolution imaging for sub-IR frequencies
论文作者
论文摘要
对于旨在准确确定层厚度的测量值，由于聚焦光束所需的角度射线分布，对光学厚度的敏感性与横向分辨率之间存在自然权衡。我们展示了一种近场成像方法，该方法可以实现次波长的横向分辨率和光学厚度灵敏度。我们在整个内部反射几何形状中照亮样品，并在近场中带有光激活的空间调节器，这允许光学厚度图像在几秒钟内进行计算重建。我们在140 GHz（波长2.15毫米）中证明了我们的方法，其中图像通常在空间分辨率上受到严重限制，并证明了对不均匀生物组织中光厚度变化的映射。
For measurements designed to accurately determine layer thickness, there is a natural trade-off between sensitivity to optical thickness and lateral resolution due to the angular ray distribution required for a focused beam. We demonstrate a near-field imaging approach that enables both sub-wavelength lateral resolution and optical thickness sensitivity. We illuminate a sample in a total internal reflection geometry, with a photo-activated spatial modulator in the near-field, which allows optical thickness images to be computationally reconstructed in a few seconds. We demonstrate our approach at 140 GHz (wavelength 2.15 mm), where images are normally severely limited in spatial resolution, and demonstrate mapping of optical thickness variation in inhomogeneous biological tissues.
