论文标题
电荷噪声和基于反射测定的电荷，旋转和Majorana量子读数中的过度误差
Charge noise and overdrive errors in reflectometry-based charge, spin and Majorana qubit readout
论文作者
论文摘要
可以通过栅极反射测量法读取包含量子点的固态Qubit。在这里，我们从理论上描述了物理机制，这些机制使这种反映基于测定法的读数方案不完美。我们讨论电荷量子台，单线旋转量子尺和Majorana Qubits。在我们的模型中，我们考虑了由于电荷噪声缓慢而导致的读数错误，并且由于过度驱动而导致过度探测导致错误。一个关键结果是，对于充电和自旋量子，读数保真度在很大的探针强度下饱和，而对于Majorana Qubits来说，有一个最佳的探针强度，可提供最大化的读数保真度。我们还指出，随着脉冲强度的提高，出现的严重读数错误以谐振方式出现，并表明这些误差与探针诱导的多光子过渡有关。除了提供针对优化读数的实用准则外，我们的研究还可能激发使用门反射量学进行设备表征的方法。
Solid-state qubits incorporating quantum dots can be read out by gate reflectometry. Here, we theoretically describe physical mechanisms that render such reflectometry-based readout schemes imperfect. We discuss charge qubits, singlet-triplet spin qubits, and Majorana qubits. In our model, we account for readout errors due to slow charge noise, and due to overdriving, when a too strong probe is causing errors. A key result is that for charge and spin qubits, the readout fidelity saturates at large probe strengths, whereas for Majorana qubits, there is an optimal probe strength which provides a maximized readout fidelity. We also point out the existence of severe readout errors appearing in a resonance-like fashion as the pulse strength is increased, and show that these errors are related to probe-induced multi-photon transitions. Besides providing practical guidelines toward optimized readout, our study might also inspire ways to use gate reflectometry for device characterization.
