论文标题
AFM电气模式中图像采集和分析的特殊性
Peculiarities of image acquirement and analysis in AFM electrical modes
论文作者
论文摘要
本文描述了在I-AFM模式下操作时通过样品表面的收集和解释当前分布图像的特殊性。它表明，I-AFM和SCM模式只能用于小型扫描场（不超过5x5平方微米），因为在扫描过程中，由于探针尖端区域的连续变化，因此在探针和样品表面之间的接触区域中由于尖端的磨损而观察到。同时，不建议对AFM的电气模式进行调查，以研究纳米物体，因为结果解释出现了许多困难，这是由于探针尖端的较大曲率半径引起的，因此是由于电气接触的大表面积。本文还证明了以I/V光谱模式的样品表面上的单个点的CVC的获得和解释的特殊性。结果表明，由于在I-AFM模式下，通过在感兴趣的点（观察到的异质性或通过表面上的异质性或通过表面的电流）获取CVC来对表面进行进一步研究，这实际上是不可能的，因为I-AFM模式是在I-AFM模式下，因为Piezoceramics的温度较大，因此在样品表面上进行了样品表面。论文中给出了改善该方法可能性的建议。
The paper describes the peculiarities of acquirement and interpretation of images of current distribution through the sample surface when operating in I-AFM mode. It shows that I-AFM and SCM modes can be successfully used only for small scanning fields (no more than 5x5 square micrometer), since during the scanning process the continuous change in the area of the probe tip and, therefore, in the contact area between the probe and the sample surface is observed because of the abrasion of the tip. At the same time electrical modes of AFM could not be recommended for the investigation of nano objects, because there appear a number of difficulties in results interpretation, caused by the big curvature radius of the probe tip and, therefore, by the big surface area of electrical contact. The paper also demonstrates the peculiarities of acquirement and interpretation of CVCs for individual points on the sample surface in I/V Spectroscopy mode. It is shown that it is practically impossible to use I/V Spectroscopy mode for additional investigation of the surface by acquiring of CVCs in the points of interest (where heterogeneities in topography or current through the surface are observed) on the sample surface in I-AFM mode, because of the big temperature drift and hysteresis of piezoceramics. Recommendations for improving the possibilities of the method are given in the paper.
