学术文献库

Electronic properties of ultrathin dielectric films consistently attract much attention since they play important roles in various electronic devices, such as field effect transistors and memory elements. Insulating properties of the gate oxide in transistors represent the key factor limiting Moore's law. The dielectric strength of the insulating film limits how much energy can be stored in nanocapacitors. The origin of the electric current in the nanometer-scale insulating barrier remains unexplained. Here we present an optically transparent Al-Al2O3-graphene nanocapacitor suitable for studying electronic transport in calibrated nanoscale dielectric films under high electric fields and with light exposure. The controllable flow of photons provides an additional powerful probe helping to resolve the puzzle of the electric conductivity in these high-quality insulating films. The dielectric alumina, Al2O3, is deposited by atomic layer deposition technology. With this device we observe a photon-assisted field emission effect, in which the effective barrier height is reduced by a quantity equal to the photon energy. Our main finding is a reversed photoeffect. Namely, at sufficiently high bias voltages the current through the dielectric film decreases as the light intensity increases. Moreover, higher photon energies correlate with stronger decreases of the current. To explain this reversed photoeffect, we present a qualitative model based on a conjecture that electrons leak into the dielectric and form charged sandpile-like branching patterns, which facilitate transport, and which can be dispersed by light.