论文标题
声子的共振热大厅效应与动态缺陷耦合
Resonant thermal Hall effect of phonons coupled to dynamical defects
论文作者
论文摘要
我们介绍了以多个能级散射出缺陷的声子的热厅系数的计算。使用基于Kubo公式的显微镜公式，我们发现声子 - 缺陷耦合中的主要贡献扰动与声子寿命成正比，并且具有“侧面跳跃”的解释。因此，热霍尔角与声子寿命无关。当声子能量等于缺陷水平间距时，对热室系数的贡献是共振。我们的结果是针对三种不同的缺陷模型获得的，这些缺陷模型适用于不同的相关电子材料。对于丘比特的伪制度，我们提出了一个与杂质量子旋转的声子模型，在存在的准静态磁序中，以及各向同性的Zeeman耦合到所施加的磁场，并且没有自旋轨道相互作用。
We present computations of the thermal Hall coefficient of phonons scattering off a defect with multiple energy levels. Using a microscopic formulation based on the Kubo formula, we find that the leading contribution perturbative in the phonon-defect coupling is proportional to the phonon lifetime, and has a `side-jump' interpretation. Consequently, the thermal Hall angle is independent of the phonon lifetime. The contribution to the thermal Hall coefficient is at resonance when the phonon energy equals a defect level spacing. Our results are obtained for three different defect models, which apply to different correlated electron materials. For the pseudogap regime of the cuprates, we propose a model of phonons coupled to an impurity quantum spin in the presence of quasi-static magnetic order with an isotropic Zeeman coupling to the applied field, and without spin-orbit interaction.
