论文标题
DC耦合电阻硅检测器，用于4D跟踪
DC-coupled resistive silicon detectors for 4-D tracking
论文作者
论文摘要
在这项工作中，我们介绍了一个新的设计概念：基于LGAD技术的DC耦合电阻硅探测器。这种新方法旨在解决第一代AC耦合电阻硅探测器（RSD）的一些已知特征。我们的仿真基于两个软件包的组合（weightfield2和ltspice）利用快速混合方法。它表明，RSD设计的关键特征是维护的，得出了出色的时序和空间分辨率：几十ps和几微米。在演讲中，我们将概述优化方法和仿真结果。我们将介绍有关改变N+层电阻率与低抗性环以及可实现的时间和空间分辨率之间比率的效果的详细研究。
In this work, we introduce a new design concept: the DC-Coupled Resistive Silicon Detectors, based on the LGAD technology. This new approach intends to address a few known features of the first generation of AC-Coupled Resistive Silicon Detectors (RSD). Our simulation exploits a fast hybrid approach based on a combination of two packages, Weightfield2 and LTSpice. It demonstrates that the key features of the RSD design are maintained, yielding excellent timing and spatial resolutions: a few tens of ps and a few microns. In the presentation, we will outline the optimization methodology and the results of the simulation. We will present detailed studies on the effect of changing the ratio between the n+ layer resistivity and the low-resistivity ring and on the achievable temporal and spatial resolution.
