论文标题

接近K边缘的光电离和光吸收,双重和三重充电的硅离子

Near K-Edge Photoionization and Photoabsorption of Singly, Doubly, and Triply Charged Silicon Ions

论文作者

Schippers, S., Stock, S., Buhr, T., Perry-Sassmannshausen, A., Reinwardt, S., Martins, M., Müller, A., Fritzsche, S.

论文摘要

为Si $^+$和Si $^{2+} $ ions的双重,三重和四倍的光电离给出了实验和理论结果,以及单个光子的Si $^{3+} $ ions的双光电离。该实验在同步子光源处采用了光子离子合并的梁技术。实验光子能量范围1835--1900 EV包括与$ 1S $电子对更高子壳的激发以及随后的自由度化有关的共振。这些共振的能量,宽度和强度是从高分辨率光电离测量中提取的,并推断出K壳离子化中性硅的核心孔寿命。此外,从大规模的多构型迪拉克 - 哈特里库克(MCDHF)计算中获得了用于光吸附和多次光电离的理论横截面。本计算与实验的一致性要比以前发表的理论结果好得多。指出了实验室数据准确的能量校准的重要性。目前的基准结果对于区分气态中的硅吸收以及星际介质的固体成分(粉尘颗粒)特别有用。

Experimental and theoretical results are presented for double, triple, and quadruple photoionization of Si$^+$ and Si$^{2+}$ ions and for double photoionization of Si$^{3+}$ ions by a single photon. The experiments employed the photon-ion merged-beams technique at a synchrotron light source. The experimental photon-energy range 1835--1900 eV comprises resonances associated with the excitation of a $1s$ electron to higher subshells and subsequent autoionization. Energies, widths, and strengths of these resonances are extracted from high-resolution photoionization measurements, and the core-hole lifetime of K-shell ionized neutral silicon is inferred. In addition, theoretical cross sections for photoabsorption and multiple photoionization were obtained from large-scale Multi-Configuration Dirac-Hartree-Fock (MCDHF) calculations. The present calculations agree with the experiment much better than previously published theoretical results. The importance of an accurate energy calibration of laboratory data is pointed out. The present benchmark results are particularly useful for discriminating between silicon absorption in the gaseous and in the solid component (dust grains) of the interstellar medium.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源