论文标题
Ti2O3薄膜的电子带结构,通过角度分辨光发光学研究
Electronic band structure of Ti2O3 thin films studied by angle-resolved photoemission spectroscopy
论文作者
论文摘要
Ti2O3在约150 K的宽温度范围内显示出大约450 K的独特金属绝缘体过渡(MIT)。这种宽阔的MIT伴随着晶格变形与在大多数其他过渡金属氧化物中观察到的尖锐MIT不同。一个长期的问题是确定电子电子相关性在Ti2O3的电子结构和MIT中的作用。但是,缺乏有关TI2O3频带结构的信息阻碍了研究其异常物理特性的起源。在这里,我们报告了通过角度分辨光发射光谱(ARPES)的轻微孔掺杂的绝缘Ti2O3膜的电子带结构。 Arpes在单晶外延膜的表面显示清晰的带分散。根据密度功能理论(DFT)和广义梯度近似 + U校正,将实验获得的带结构与带结构计算结果进行了比较。获得的带结构与在U = 2.2 eV处的DFT计算非常吻合,这表明电子电子相关性在Ti2O3的电子结构中起着重要作用。此外,用不同U的详细分析表明,Ti2O3中特征性MIT的起源是由于晶格变形而导致的费米表面变化引起的半学或半学 - 触发器转变。
Ti2O3 exhibits a unique metal-insulator transition (MIT) at approximately 450 K over a wide temperature range of ~ 150 K. This broad MIT accompanied by lattice deformation differs from the sharp MITs observed in most other transition-metal oxides. A long-standing issue is determining the role of electron-electron correlation in the electronic structure and MIT of Ti2O3. However, the lack of information about the band structure of Ti2O3 has hindered investigating the origin of its unusual physical properties. Here, we report the electronic band structure of insulating Ti2O3 films with slight hole doping by angle-resolved photoemission spectroscopy (ARPES). ARPES showed clear band dispersion on the surface of single-crystalline epitaxial films. The experimentally obtained band structures were compared with band-structure calculation results based on density functional theory (DFT) with generalized gradient approximation + U correction. The obtained band structures are in good agreement with the DFT calculations at U = 2.2 eV, suggesting that electron-electron correlation plays an important role in the electronic structure of Ti2O3. Furthermore, the detailed analyses with varying U suggest that the origin of the characteristic MIT in Ti2O3 is a semimetal-semimetal or semimetal-semiconductor transition caused by changes in the Fermi surface due to lattice deformation.