论文标题
从超导体的稳定性和放松到安德里·埃弗利夫（Andreev）的反射
From superconductor stability and relaxation to Andreev reflections
论文作者
论文摘要
如何从电阻率测量中获得的结果确定临界温度如何确定？本文提出了使用电阻网络的非常规方法，以找到该问题的答案。第一步，最近建议的动态放松模型被完善，并扩展到其适当的适用性和能力范围（超导体稳定性针对淬火）。此步骤解决了在临界温度附近的电阻率与温度曲线的弯曲。在第二步中，提出了热波动问题的替代解决方案。从这两个结果中，都可以假设存在非本地的过渡边界层，即临界温度周围的温度不确定性。最后，如果必须考虑任何非欧马贡献（例如Andreev Reflection或Josephson Currents），则通过这种方法明显地通过超导体/正常导体薄膜连接来计算总电流的严重限制。这个问题与多组分传热平行。
How exactly can critical temperature be determined from results obtained in resistivity measurements? An unconventional approach using an electrical resistance network is presented in this paper to find an answer to this question. In a first step, a recently suggested, dynamic relaxation model is refined and extended beyond its proper applicability and competence range (superconductor stability against quench). This step addresses bending of the resistivity vs. temperature curves near critical temperature. In a second step, an alternative solution of the thermal fluctuations problem is presented. From both results, existence of a non-local, transition boundary layer can be postulated, a temperature uncertainty around critical temperature. Finally, severe limitations to calculate total current through superconductor/normal conductor thin film junctions become obvious from this approach if any non-Ohmic contributions (like Andreev reflection or Josephson currents) have to be taken into account. This problem is a parallel to multi-component heat transfer.
