论文标题
超高Q因子微孔子的干涉腔腔响铃技术
Interferometric cavity ring-down technique for ultra-high Q-factor microresonators
论文作者
论文摘要
微孔子（MRS）是集成光学元件的关键组成部分。结果，通过质量因子（Q）衡量的其能量存储能力的估计至关重要。但是，在具有高/超高Q的MR中，表面壁粗糙度主导了内在的Q，并在反传播模式之间产生耦合。这将通常的尖锐的单共振分裂，并难以使用经典方法来评估Q。在这里，我们从理论上表明可以在腔度戒指（CRD）方法中利用干涉测量值来测量MR的最终Q。实际上，在适当的条件下，谐振双重表合并为单个Lorentzian，MR的时间动力学假定单模共振器的通常行为不受反向散射影响。这允许在MR的充电和放电时间中获得典型的指数衰减，从而通过测量光子寿命来估算其最终Q。
Microresonators (MRs) are key components in integrated optics. As a result, the estimation of their energy storage capacity as measured by the quality factor (Q) is crucial. However, in MR with high/ultra-high Q, the surface-wall roughness dominates the intrinsic Q and generates a coupling between counter-propagating modes. This splits the usual sharp single resonance and makes difficult the use of classical methods to assess Q. Here, we theoretically show that an interferometric excitation can be exploited in a Cavity Ring-Down (CRD) method to measure the ultimate Q of a MR. In fact, under suitable conditions, the resonant doublet merges into a single Lorentzian and the time dynamics of the MR assumes the usual behavior of a single-mode resonator unaffected by backscattering. This allows obtaining a typical exponential decay in the charging and discharging time of the MR, and thus, estimating its ultimate Q by measuring the photon lifetime.
