论文标题
以AFM技术为特征的扭转元边界相
Twist-grain boundary phase characterized by AFM technique
论文作者
论文摘要
扭曲晶界（TGB）阶段代表具有常规缺陷阵列的液晶系统。在我们的研究中，我们研究了具有稳定的TGBC阶段的化合物，并通过各种实验技术建立了其结构。我们通过AFM显微镜观察了近晶膜的表面，并检测到了周期性的缓解。我们发现位移幅度很少，其周期性约为500 nm。这种周期性符合TGBC块的周期性通过偏振显微镜估计的旋转。表面调制是通过TGBC结构的变形来解释的，TGBC结构是在TGBC膜上产生的。提出了一个简化的模型，该模型提出了样品内部旋转的TGBC块而发生的近晶表面位移。 TGBC阻断的变形不同，具体取决于其方向相对于AFM显微镜悬臂尖端作用的力的方向，探测了近晶表面。
Twist grain boundary (TGB) phases represent liquid crystalline systems with a regular array of defects. In our research, we studied a compound with a stable TGBC phase and established its structure by various experimental techniques. We observed the surface of the smectic film by AFM microscope and detected a periodic relief. We found that the displacement amplitude is few nanometers with the periodicity about 500 nm. Such periodicity is in accordance with the periodicity of the TGBC blocks rotation estimated by polarizing microscopy. The surface modulation is explained by the deformation of TGBC structure, which is created on TGBC films. A simplified model interpreting the observed smectic surface displacement to occur as a consequence of rotating TGBC blocks inside the sample is proposed. TGBC blocks deform differently depending on their orientation with respect to the force acting by the tip of AFM microscope cantilever probing the smectic surface.
