论文标题
利用存储芯片的纳米电信特性，以防止IC伪造
Exploiting Nanoelectronic Properties of Memory Chips for Prevention of IC Counterfeiting
论文作者
论文摘要
这项研究提出了一种非易失性记忆（NVM）芯片的方法的方法。特别是，我们在实验上证明了一种用于检测（i）集成电路（IC）起源，（ii）回收或使用的NVM芯片的广义方法，以及（iii）芯片中使用的位置（地址）的鉴定。我们提出的方法可以检查商业货架（COTS）NVM芯片的延迟和可变性签名。所提出的技术需要低周期（〜100）预处理，并利用机器学习（ML）算法。我们观察到延迟的演变（部门擦除或页面写入）的不同趋势，以及来自不同供应商的不同NVM技术的循环。 ML辅助方法用于检测IC制造商，其精度为95.1％的IC制造商在准备好的测试数据集中获得了95.1％的精度，该数据集由3种不同的NVM技术组成，包括6个不同的制造商（9种芯片）。
This study presents a methodology for anticounterfeiting of Non-Volatile Memory (NVM) chips. In particular, we experimentally demonstrate a generalized methodology for detecting (i) Integrated Circuit (IC) origin, (ii) recycled or used NVM chips, and (iii) identification of used locations (addresses) in the chip. Our proposed methodology inspects latency and variability signatures of Commercial-Off-The-Shelf (COTS) NVM chips. The proposed technique requires low-cycle (~100) pre-conditioning and utilizes Machine Learning (ML) algorithms. We observe different trends in evolution of latency (sector erase or page write) with cycling on different NVM technologies from different vendors. ML assisted approach is utilized for detecting IC manufacturers with 95.1 % accuracy obtained on prepared test dataset consisting of 3 different NVM technologies including 6 different manufacturers (9 types of chips).
