论文标题

摩西$ _ {2} $/hbn/wse $ _ {2} $杂质结构中的充电转移动力学

Charge transfer dynamics in MoSe$_{2}$/hBN/WSe$_{2}$ heterostructures

论文作者

Yoon, Yoseob, Zhang, Zuocheng, Qi, Ruishi, Joe, Andrew Y., Sailus, Renee, Watanabe, Kenji, Taniguchi, Takashi, Tongay, Sefaattin, Wang, Feng

论文摘要

超快电荷转移过程提供了一种在直接接触的过渡金属二进制基因元素(TMD)层中创建层间激子的一种方法。由TMD/HBN/TMD组成的更复杂的异质结构可实现控制层间激子特性并实现新颖的激子现象的新方法,例如激子绝缘子和冷凝物,在此期望寿命更长的情况下。在这项工作中,我们在实验中研究了由Mose $ _ {2} $和WSE $ _ {2} $单层之间的1 nm厚的HBN垫片组成的异质结构中的电荷传输动力学。我们通过HBN障碍物观察到从Mose $ _ {2} $到WSE $ _ {2} $的孔转移,其时间常数为500 ps,比没有间隔者的TMD层之间的时间较高3个数量级以上。此外,我们观察到高激发密度下的层间电荷转移与内部激子灭绝过程之间的强烈竞争。我们的工作为理解TMD/HBN/TMD异质结构中电荷传输途径的可能性开辟了可能性,以有效地生成和控制层间激子。

Ultrafast charge transfer processes provide a facile way to create interlayer excitons in directly contacted transition metal dichalcogenide (TMD) layers. More sophisticated heterostructures composed of TMD/hBN/TMD enable new ways to control interlayer exciton properties and achieve novel exciton phenomena, such as exciton insulators and condensates, where longer lifetimes are desired. In this work, we experimentally study the charge transfer dynamics in a heterostructure composed of a 1 nm thick hBN spacer between MoSe$_{2}$ and WSe$_{2}$ monolayers. We observe the hole transfer from MoSe$_{2}$ to WSe$_{2}$ through the hBN barrier with a time constant of 500 ps, which is over 3 orders of magnitude slower than that between TMD layers without a spacer. Furthermore, we observe strong competition between the interlayer charge transfer and intralayer exciton-exciton annihilation processes at high excitation densities. Our work opens possibilities to understand charge transfer pathways in TMD/hBN/TMD heterostructures for the efficient generation and control of interlayer excitons.

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